Modeling malfunctions of the circuits arising from external influence

Vardan Mkrttchian; Asmik Eranosian; Armen Simonyan; Knarik Mkrtchyan

doi:10.1117/12.368452

8 October 1999 Modeling malfunctions of the circuits arising from external influence

Vardan Mkrttchian, Asmik Eranosian, Armen Simonyan, Knarik Mkrtchyan

Proceedings Volume 3893, Design, Characterization, and Packaging for MEMS and Microelectronics; (1999) https://doi.org/10.1117/12.368452
Event: Asia Pacific Symposium on Microelectronics and MEMS, 1999, Gold Coast, Australia

Abstract

While analyzing on the logical level of the digital schemes taking into consideration the external effects, each unit of the scheme is characterized by the variable Q, the value of which points not to the stationary condition of the unit 0 or 1, but to the degree of difference between the state of the given unit and the stationary condition f the value of an external effect. The state of the given unit are input besides the usual variables in to the logical function of each element. These dependencies are different models for determining the external effects. The system of analysis of programs must be open with respect to models type for determining the external effects. The approach described above has been realized in the system of modeling programs of digital integral schemes in sliding mode and the experiments carried out allow as to state that this strategy increases the functioning speed for more than 10 orders while the loss of accuracy is 1-5 percent.

Citation Download Citation

Vardan Mkrttchian, Asmik Eranosian, Armen Simonyan, and Knarik Mkrtchyan "Modeling malfunctions of the circuits arising from external influence", Proc. SPIE 3893, Design, Characterization, and Packaging for MEMS and Microelectronics, (8 October 1999); https://doi.org/10.1117/12.368452

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