Paper
3 March 2000 Thermographic profiles on optical surfaces: from insulators to metals
Rashmi S. Shah, Alan F. Stewart, Jerry Ray Bettis, Lynn Bonsall
Author Affiliations +
Abstract
IR thermal imagin has been sued to study absorption in coated optical surface.s THis technique has demonstrated the ability to rapidly determine coating quality on thermally insulating substrates such as fused silica. The application of this technique to coatings deposited on thermal conductive substrates such as sapphire, silicon or copper is discussed. Data and the result of modeling are compared to show the limitations and potential of this technique for measurement and study of different classes of optical components.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rashmi S. Shah, Alan F. Stewart, Jerry Ray Bettis, and Lynn Bonsall "Thermographic profiles on optical surfaces: from insulators to metals", Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, (3 March 2000); https://doi.org/10.1117/12.379349
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KEYWORDS
Thermography

Silica

Temperature metrology

Aluminum

Thermal modeling

Cameras

Data modeling

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