Pendellosung fringes in distorted crystals

M. D. Raransky; Igor M. Fodchuk; Ya. M. Struk; S. V. Bobrovnik

doi:10.1117/12.370436

18 November 1999 Pendellosung fringes in distorted crystals

M. D. Raransky, Igor M. Fodchuk, Ya. M. Struk, S. V. Bobrovnik

Proceedings Volume 3904, Fourth International Conference on Correlation Optics; (1999) https://doi.org/10.1117/12.370436
Event: International Conference on Correlation Optics, 1999, Chernivsti, Ukraine

Abstract

Influences of slight and severe distortions, appearing under a focused load, on intensity oscillation in thickness of wedge-similar and flat Si crystals are investigated experimentally and by the numerical solution of Takagi equations. It is shown that scattering processes cause the bend and focusing (defocusing) x-ray trace during transmission through an environment with slowly varied refraction parameter in the case of slight distortions. In the region of severe distortions the processes of interbranch scattering take place.

Citation Download Citation

M. D. Raransky, Igor M. Fodchuk, Ya. M. Struk, and S. V. Bobrovnik "Pendellosung fringes in distorted crystals", Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); https://doi.org/10.1117/12.370436

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