Paper
5 July 2000 Scalable pattern generator data path: for the future
Charlotta Johansson, Lars Ivansen, Anders Thuren, Per Liden, Mans Bjuggren
Author Affiliations +
Abstract
With the shrinking design rules for semiconductors mask data complexity increases continuously. The increasing use of OPC, which has become common for advanced masks, reinforces this trend. The requirements on data processing increase and make it a possible bottleneck. Increasing write times directly impact the cost of the photomask. These facts raise the question of how to design a data path that will not limit the writing speed and throughput of a pattern generator.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charlotta Johansson, Lars Ivansen, Anders Thuren, Per Liden, and Mans Bjuggren "Scalable pattern generator data path: for the future", Proc. SPIE 4000, Optical Microlithography XIII, (5 July 2000); https://doi.org/10.1117/12.389055
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KEYWORDS
Data modeling

Photomasks

Data processing

Transistors

Computer simulations

Electronics

Optical proximity correction

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