Laser fluorescence for the detection of oil pollutants in the environment

Yi He; Jixiang Yan; Jiaze Li; Jie Liu; Changqing Yu

doi:10.1117/12.401779

5 October 2000 Laser fluorescence for the detection of oil pollutants in the environment

Yi He, Jixiang Yan, Jiaze Li, Jie Liu, Changqing Yu

Proceedings Volume 4223, Instruments for Optics and Optoelectronic Inspection and Control; (2000) https://doi.org/10.1117/12.401779
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

A laboratory unit is described that was designed to detect and identify the oil pollutants in the environment by means of the laser-induced fluorescence spectrum analyzer. UV laser beam from third harmonics of the Nd:YAG laser is used to excite target oil. The multichannel detection system consists of a spectrometer, a scientific-grade gated ICCD camera and a digital delay generator. A personal computer is responsible for the control for the whole system as well as for the data processing. In the experiment, the laser beam is directed toward the samples while the return fluorescence signals is collected by a Cassegrainian reflecting telescope. The received signals pass through a bunch of fibers, and go into the input slit of the spectrometer. The fiber bunch includes 19 fibers, one end of which take shape of disc to collect the signals from the telescope while the other arrange in a row to match the spectrometer slit. As the results, the fluorescence emitting spectrum of sample oil under the illumination of laser beam wavelength of 355nm is in the range 400nm to 700nm and center around 520nm. The laser and the receive system are both at a distance 25m from the target since the restriction of the working place. The system has the detection capacity for more distance.

Citation Download Citation

Yi He, Jixiang Yan, Jiaze Li, Jie Liu, and Changqing Yu "Laser fluorescence for the detection of oil pollutants in the environment", Proc. SPIE 4223, Instruments for Optics and Optoelectronic Inspection and Control, (5 October 2000); https://doi.org/10.1117/12.401779

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