Paper
20 October 2000 Preparation of crystalline TiNi shape-memory alloy thin film for MEMS applications
Yongqing Fu, Hejun Du, Weiming Huang, Xu Huang, Jianmin Miao, Yong Liu
Author Affiliations +
Proceedings Volume 4230, Micromachining and Microfabrication; (2000) https://doi.org/10.1117/12.404895
Event: International Symposium on Microelectronics and Assembly, 2000, Singapore, Singapore
Abstract
Thin film shape-memory alloys have been recognized as a promising and high performance material in the field of microelectromechanical systems applications. In this investigation, TiNi films were prepared by sputtering Ti and Ni target in argon gas using a magnetron sputtering system. Chemical composition, crystallography, microstructure and phase transformation behaviors of the deposited TiNi film were studied. Differential scanning calorimeter results showed that a two-stage transformation occurs in a sequence of monoclinic martensitic phase to rhombohedral phase, then to B2 phase upon heating, and vice versa on cooling. X-ray diffraction analysis also revealed the crystalline structure changes with the change of the temperatures. Nano- indentation reveals the elastic modulus of the film is about 5.11 GPa and the film intrinsic hardness is 2.84 +/- 0.5 GPa. By depositing TiNi films on the bulk micromachined Si cantilever structures, we obtained micro-grippers exhibiting a good shape-memory effect.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yongqing Fu, Hejun Du, Weiming Huang, Xu Huang, Jianmin Miao, and Yong Liu "Preparation of crystalline TiNi shape-memory alloy thin film for MEMS applications", Proc. SPIE 4230, Micromachining and Microfabrication, (20 October 2000); https://doi.org/10.1117/12.404895
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KEYWORDS
Crystals

Microelectromechanical systems

Thin films

Sputter deposition

Temperature metrology

Shape memory alloys

Nickel

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