Paper
14 May 2001 Angular emission profiles and coherence length measurements of highly efficient,low-voltage resonant-cavity light-emitting diodes operating around 650 nm
Jonathan W. Gray, Rupert F. Oulton, Paul N. Stavrinou, Mark Whitehead, Gareth Parry, Geoff Duggan, Ricardo C. Coutinho, David R. Selviah
Author Affiliations +
Abstract
We present results on Resonant Cavity Light Emitting Diodes (RCLEDs) emitting at 650 nm, which have high efficiencies and low voltages. In particular, we report on the angular properties of these devices, and highlight the observation that overall spectral linewidth increases with collection angle. This unusual property of RCLEDs is largely a consequence of employing a microcavity in the design. An additional contributing factor is the relative distribution of gain amongst the cavity modes (i.e. the level of tuning or detuning of the underlying emission, defined with respect to the longitudinal cavity mode). We have used measurement techniques which spectrally resolve angular radiation profiles to determine the (de)tuning directly. Moreover, these profiles demonstrate how the overall spectral linewidth increases with collection angle. To this end, we have developed a semi- empirical method for determining the overall linewidth as a function of emission numerical aperture (NA). A 4 nm detuned device has been investigated and linewidths have been found to increase from 3.1 nm to 13.6 nm over a range of NA approximately equals 0 to NA equals 1, an increase by a factor of around 4. Obviously, a variable linewidth also implies a variable coherence length with NA. Consequently, the coherence length was found to decrease from 30 micrometer to 9 micrometer over the same range. Independent coherence length measurements were carried out by direct interferometric measurements, and confirmed the expected trends.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan W. Gray, Rupert F. Oulton, Paul N. Stavrinou, Mark Whitehead, Gareth Parry, Geoff Duggan, Ricardo C. Coutinho, and David R. Selviah "Angular emission profiles and coherence length measurements of highly efficient,low-voltage resonant-cavity light-emitting diodes operating around 650 nm", Proc. SPIE 4278, Light-Emitting Diodes: Research, Manufacturing, and Applications V, (14 May 2001); https://doi.org/10.1117/12.426836
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Cited by 3 scholarly publications.
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KEYWORDS
Monochromators

Light emitting diodes

Gallium

Integrating spheres

Aluminum

External quantum efficiency

Interferometry

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