Paper
24 July 2001 Nondestructive imaging with mercuric iodide thick film x-ray detectors
Michael M. Schieber, Haim Hermon, Asaf Zuck, Alexander I. Vilensky, Leonid Melekhov, Michael Lukach, Evgenie Meerson, Yehezkel Saado, E. Shtekel, Benjamin Reisman, G. Zentai, L. Partain, E. Seppi, Raisa Pavlyuchkova, G. Virshup, Robert A. Street, Steve E. Ready
Author Affiliations +
Abstract
Polycrystalline mercuric iodide (HgI2) photoconductor material was directly deposited on flat panel amorphous silicon (a-Si) thin film transistor (TFT) pixel arrays in order to test their application as direct x-ray conversion detectors. The 4' x 4' and 2' x 2' detector plates were fabricated either by Physical Vapor Deposition (PVD) or the Screen-Print (SP) method. Although developed for medical radiological imaging, they can also be used for nondestructive test imaging. The present HgI2 arrays have 100 μm x 100 μm pixels on the 2' x 2' detector and 139μm x 139μm on the 4' x 4' imager. The initial results are very promising and show high x-ray sensitivity and low leakage current. The advantage of these detectors is that they can be directly deposited on the pixellated arrays containing the TFTs and other electronic read out circuits and can be fabricated in large sizes. These polycrystalline PVD-HgI2 thick film detectors have now been fabricated up to 1,800μm thick, which makes them also useful for higher-energy X-ray applications. Imaging results obtained by both PVD- and SP-HgI2 will be shown. The effect of the crystallite size on the imaging properties will be demonstrated and the difference in sensitivity applying positive or negative bias on the top electrode will be discussed. Comparison of x-ray sensitivity to other photoconductor materials such a-Se and PbI2 will also be presented.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael M. Schieber, Haim Hermon, Asaf Zuck, Alexander I. Vilensky, Leonid Melekhov, Michael Lukach, Evgenie Meerson, Yehezkel Saado, E. Shtekel, Benjamin Reisman, G. Zentai, L. Partain, E. Seppi, Raisa Pavlyuchkova, G. Virshup, Robert A. Street, and Steve E. Ready "Nondestructive imaging with mercuric iodide thick film x-ray detectors", Proc. SPIE 4335, Advanced Nondestructive Evaluation for Structural and Biological Health Monitoring, (24 July 2001); https://doi.org/10.1117/12.434200
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Cited by 3 scholarly publications.
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KEYWORDS
Imaging systems

X-rays

Sensors

Image resolution

Nondestructive evaluation

Surface plasmons

X-ray detectors

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