Paper
14 September 2001 Effects of 95% integral vs. FWHM bandwidth specifications on lithographic imaging
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Abstract
Bandwidth of a laser spectrum is generally specified in terms of the full-width-at-half-maximum (FWHM) metric. Another bandwidth specification is based on the 95% integral energy (E95%) of the spectrum. While providing a more complete information about the spectral shape, E95% bandwidth is very sensitive to small changes in spectral background intensity. In this work, both bandwidth specifications and their effects on aerial image properties are evaluated using computer simulations. Also, in order to obtain a more comprehensive understanding of illumination spectrum effects on lithographic imaging, aerial image sensitivity to the shift of central wavelength and to the change of spectral background intensity is investigated. Results show that the overall shape of the laser spectrum is critically important, and that the E95% metric is more suitable for bandwidth specification.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Armen Kroyan, Ivan Lalovic, and Nigel R. Farrar "Effects of 95% integral vs. FWHM bandwidth specifications on lithographic imaging", Proc. SPIE 4346, Optical Microlithography XIV, (14 September 2001); https://doi.org/10.1117/12.435661
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CITATIONS
Cited by 14 scholarly publications and 10 patents.
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KEYWORDS
Lithography

Critical dimension metrology

Metrology

Chromatic aberrations

Computer simulations

Cadmium

Lithographic illumination

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