Paper
3 October 2001 In-line detection and evaluation of surface defects on thin metallic wires
Juan Carlos Martinez-Anton, Philip Siegmann, Luis Miguel Sanchez-Brea, Eusebio Bernabeu, Jose Antonio Gomez-Pedrero, Hector A. Canabal
Author Affiliations +
Abstract
We have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensity patterns in a simple way. The presented apparatus consists basically in a grating-divided laser beam incident on angular equidistant points. A CCD and an associated optics capture the information of the whole wire perimeter at once. Analytic rudiments are provided in agreement with the experimental results.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juan Carlos Martinez-Anton, Philip Siegmann, Luis Miguel Sanchez-Brea, Eusebio Bernabeu, Jose Antonio Gomez-Pedrero, and Hector A. Canabal "In-line detection and evaluation of surface defects on thin metallic wires", Proc. SPIE 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, (3 October 2001); https://doi.org/10.1117/12.445586
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Cited by 4 scholarly publications.
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KEYWORDS
Reflection

Inspection

Mirrors

Prototyping

Polarization

Defect detection

Diffraction

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