Paper
10 December 2001 Effects of particle shape on particle identification and scatter predictions
Vladimir I. Ivakhnenko, John C. Stover, Craig A. Scheer, Yuri A. Eremin
Author Affiliations +
Abstract
Laser particle scanners are traditionally calibrated with polystyrene latex spheres, and these spheres are used to create a sizing scale in light scatter equivalents. Particle scatter signals can vary strongly with particle materials, thus concealing the true particle size. As previously reported, particle material identification in a laser scanner will allow true sizing of spherical particles through the application of accurate scatter models. This paper reports extending that work to non-spherical particles through the use of modeling scatter from ellipsoidal particles.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir I. Ivakhnenko, John C. Stover, Craig A. Scheer, and Yuri A. Eremin "Effects of particle shape on particle identification and scatter predictions", Proc. SPIE 4449, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II, (10 December 2001); https://doi.org/10.1117/12.450087
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KEYWORDS
Particles

Scanners

Optical spheres

Calibration

Silicon

Copper

Semiconducting wafers

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