Photoemission characterization of interfaces between Au and pentacene

Neil J. Watkins; Quoc Toan Le; Serkan Zorba; Li Yan; Yongli Gao; Shelby F. Nelson; Chung-Chen Shelby Kuo; Thomas N. Jackson

doi:10.1117/12.451472

21 December 2001 Photoemission characterization of interfaces between Au and pentacene

Neil J. Watkins, Quoc Toan Le, Serkan Zorba, Li Yan, Yongli Gao, Shelby F. Nelson, Chung-Chen Shelby Kuo, Thomas N. Jackson

Author Affiliations +

Proceedings Volume 4466, Organic Field Effect Transistors; (2001) https://doi.org/10.1117/12.451472
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

We report the characterization of interface formation between Au(Au) and pentacene, an organic material used as an active material in Organic Thin-Film Transistors, using x- ray and ultraviolet photoelectron spectroscopy (XPS and UPS). XPS results indicate that there is no chemical reaction between Au and pentacene regardless of deposition order. UPS results indicate the presence of interface dipoles at both the pentacene/Au and the Au/pentacene interfaces. In addition there are indications of band- bending at the Au/pentacene interface.

Citation Download Citation

Neil J. Watkins, Quoc Toan Le, Serkan Zorba, Li Yan, Yongli Gao, Shelby F. Nelson, Chung-Chen Shelby Kuo, and Thomas N. Jackson "Photoemission characterization of interfaces between Au and pentacene", Proc. SPIE 4466, Organic Field Effect Transistors, (21 December 2001); https://doi.org/10.1117/12.451472

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