Paper
28 January 2002 Analysis of transient effects induced by neutrons on a CCD image sensor
Jacques Baggio, Martial Martinez, Claudine D'hose, Olivier Musseau
Author Affiliations +
Proceedings Volume 4547, Photonics for Space and Radiation Environments II; (2002) https://doi.org/10.1117/12.454383
Event: International Symposium on Remote Sensing, 2001, Toulouse, France
Abstract
This paper is focused on transient effects produced by neutrons and gamma on a CCD sensor. The main effect encountered, due to neutron interaction in the silicon is random excitation of individual pixel or pixel clusters. We have investigated the different image degradations with a 14 MeV pulsed neutron source as a function of angle of incidence and CCD camera parameters. A complete analysis has been achieved for all fluences between 104 and 107 c/cm2 including spectra of neutron induced noise. We have found a linear dependence of the number of bright and saturated pixels with fluence. The number and size of pixel clusters increase with fluence particularly for grazing angle. In a second time we have investigated gamma effects which increase the background noise of the CCD. We have compared their effects to the previous results obtained with 14 MeV neutrons to discuss on image processing algorithms to correct these phenomena.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jacques Baggio, Martial Martinez, Claudine D'hose, and Olivier Musseau "Analysis of transient effects induced by neutrons on a CCD image sensor", Proc. SPIE 4547, Photonics for Space and Radiation Environments II, (28 January 2002); https://doi.org/10.1117/12.454383
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Cited by 3 scholarly publications.
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KEYWORDS
Charge-coupled devices

CCD image sensors

Particles

Silicon

Scattering

Diagnostics

Information operations

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