Dispersion measurement of tapered air-silica microstructure fiber by white-light interferometry

Qinghao Ye; Chris Xu; Xiang Liu; Wayne H. Knox; Man F. Yan; Robert S. Windeler; Benjamin J. Eggleton

doi:10.1117/12.444899

19 October 2001 Dispersion measurement of tapered air-silica microstructure fiber by white-light interferometry

Qinghao Ye, Chris Xu, Xiang Liu, Wayne H. Knox, Man F. Yan, Robert S. Windeler, Benjamin J. Eggleton

Proceedings Volume 4579, Optical Fiber and Planar Waveguide Technology; (2001) https://doi.org/10.1117/12.444899
Event: Asia-Pacific Optical and Wireless Communications Conference and Exhibit, 2001, Beijing, China

Abstract

Dispersion properties of the novel tapered air-silica microstructure fibers are measured between 1.3 and 1.65 micrometers by white-light interferometry. Dispersion values ((beta) ₂) of -181 ps²/km and -152 ps²/km were obtained for 2.2 micrometers and 3 micrometers core sizes, respectively, at (lambda) equals1.55 micrometers .

Citation Download Citation

Qinghao Ye, Chris Xu, Xiang Liu, Wayne H. Knox, Man F. Yan, Robert S. Windeler, and Benjamin J. Eggleton "Dispersion measurement of tapered air-silica microstructure fiber by white-light interferometry", Proc. SPIE 4579, Optical Fiber and Planar Waveguide Technology, (19 October 2001); https://doi.org/10.1117/12.444899

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