Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors

M. M. Gourary; S. G. Rusakov; S. L. Ulyanov; M. M. Zharov; B. J. Mulvaney

doi:10.1117/12.463477

30 April 2002 Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors

M. M. Gourary, S. G. Rusakov, S. L. Ulyanov, M. M. Zharov, B. J. Mulvaney

Proceedings Volume 4761, Second Conference on Photonics for Transportation; (2002) https://doi.org/10.1117/12.463477
Event: Second Conference on Photonics for Transportation, 2001, Sochy, Russian Federation

Abstract

This paper presents an approach for noise characterization of read-out circuits for CMOS image sensors in frames of transient noise analysis. It provides computation of the complete probabilistic characterization of such circuits. The method is efficient because no time-consuming convolution-like procedures are used. The flicker noise is naturally taken into account without additional computational efforts.

Citation Download Citation

M. M. Gourary, S. G. Rusakov, S. L. Ulyanov, M. M. Zharov, and B. J. Mulvaney "Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors", Proc. SPIE 4761, Second Conference on Photonics for Transportation, (30 April 2002); https://doi.org/10.1117/12.463477

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