Paper
5 November 2002 Observation of the local field distribution in photonic crystal microcavity by SNOM technique
Author Affiliations +
Abstract
The spatial distribution of the local optical field at the cleavage of photonic crystal smicrocavity has been obtained by the scanning near-field optical microscope (SNOM). The localization of optical radiation at microcavity resonant wavelength in the vicinity of the λ/2 spacer layer is demonstrated. Samples of photonic crystal microcavity are prepared from silicon wafer by electrochemical etching technique. The wavelength of the microcavity mode is optimized for resonance with wavelengths of lasers. The image of the spatial distribution of optical field at the cleaved edge of the facing vertically microcavity is observed. Sample is pumped through external single-mode fiber perpendicularly to the microcavity. SNOM operates in the collection mode with the apertureless tip. We observe the localization of the resonant optical field in microcavity but we do not reveal such localization of the radiation at the non-resonant wavelength.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anton I. Maidykovski, Oleg V. Lebedev, Tatyana V. Dolgova, D. V. Kazantsev, and Andrew A. Fedyanin "Observation of the local field distribution in photonic crystal microcavity by SNOM technique", Proc. SPIE 4808, Optical Properties of Nanocrystals, (5 November 2002); https://doi.org/10.1117/12.452241
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical microcavities

Near field scanning optical microscopy

Photonic crystals

Near field optics

Wafer-level optics

Nanocrystals

Optical microscopes

Back to Top