Imaging with a scatter-probe near filed optical microscope

Victor Ruiz-Cortes; Saul Alonso Zavala Ortiz; Pedro Negrete-Regagnon; Eugenio R. Mendez; Hector Manuel Escamilla

doi:10.1117/12.529214

19 November 2003 Imaging with a scatter-probe near filed optical microscope

Victor Ruiz-Cortes, Saul Alonso Zavala Ortiz, Pedro Negrete-Regagnon, Eugenio R. Mendez, Hector Manuel Escamilla

Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.529214
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy

Abstract

Using a scanning near-field optical microscope with a metallic probe tip (Fig 1), we investigate the formation of near-field optical images. The scatter-probe is used only for converting an evanescent field to a propagating field and the detection system is in the far-field. This situation models the usual experimental set up employed in scatter-probe near-field microscopy. The calculations of the scattered intensity at constant height were based on an integral equation, method of moments approach.

Citation Download Citation

Victor Ruiz-Cortes, Saul Alonso Zavala Ortiz, Pedro Negrete-Regagnon, Eugenio R. Mendez, and Hector Manuel Escamilla "Imaging with a scatter-probe near filed optical microscope", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.529214

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