Paper
13 November 2002 Magnetostrictive characteristics of Tb-Fe-Si thin films prepared by magnetron sputtering
Mitsuaki Takeuchi, Yoshihito Matsumura, Hirohisa Uchida, Toshiro Kuji
Author Affiliations +
Proceedings Volume 4934, Smart Materials II; (2002) https://doi.org/10.1117/12.469172
Event: SPIE's International Symposium on Smart Materials, Nano-, and Micro- Smart Systems, 2002, Melbourne, Australia
Abstract
Giant magnetostrictive (GM) Tb-Fe-Si films were prepared by magnetron sputtering system. X-ray diffraction pattern showed film samples were in amorphous state. The Tb-Fe-Si film (Tb : Fe : Si = 1 : 2.7 : 0.2) prepared at 373 K showed 30 MPa tensile stresses generated by magnetostriction along in-plane direction. The film sample showed about 4.3 μΩm of electrical resistivity that is about 100 times larger than that of TbFe2 film shown about 5.9 × 10-2 μΩm. The film sample coercivity was 360 Oe. Magnetization of the film sample at 15 kOe of applied magnetic field in parallel direction to the film surface exhibited 81.0 emu/cc. We prepared giant magnetostrictive thin film with higher electrical resistivity than that of TbFe2 thin film.
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Mitsuaki Takeuchi, Yoshihito Matsumura, Hirohisa Uchida, and Toshiro Kuji "Magnetostrictive characteristics of Tb-Fe-Si thin films prepared by magnetron sputtering", Proc. SPIE 4934, Smart Materials II, (13 November 2002); https://doi.org/10.1117/12.469172
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KEYWORDS
Silicon

Iron

Terbium

Magnetostrictive materials

Sputter deposition

Thin films

Magnetism

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