Paper
10 October 2003 Implementation and measurement of gamma radiation on IR photodetectors HgCdTe IRCMOS
Sabine Suffis, Marcel Caes, Michel Tauvy, Christophe Planchat, Bruno Azais, Philippe Charre, Michel Vie
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Abstract
For some years, the IR laboratory of ONERA (France) carried out accurate electro-optical characterization on IR detectors. This paper presents some works about IR detector radiation hardness measurements: ONERA, in collaboration with DGA/CEG, measured the effects of gamma radiation on high wavelength IRCMOS. The test conditions respect hard constraints, particularly, during the radiation, detectors were cooled and operating. This paper reviews the implementation of these tests in very hard environment electromagnetic field, radiation, noise ...) and of a test protocol. In spite of severe environmental conditions, quality of measurement is comparable with those done in the laboratory. General component behaviors, transionnal and permanent effects, are summed up for very high dose rate.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sabine Suffis, Marcel Caes, Michel Tauvy, Christophe Planchat, Bruno Azais, Philippe Charre, and Michel Vie "Implementation and measurement of gamma radiation on IR photodetectors HgCdTe IRCMOS", Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); https://doi.org/10.1117/12.486307
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KEYWORDS
Sensors

Infrared detectors

Amplifiers

Mercury cadmium telluride

Electronics

Gamma radiation

Infrared radiation

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