Brief history of recombination noise in semiconductor junction devices

Paul J Edwards

doi:10.1117/12.497117

12 May 2003 Brief history of recombination noise in semiconductor junction devices

Paul J Edwards

Proceedings Volume 5113, Noise in Devices and Circuits; (2003) https://doi.org/10.1117/12.497117
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States

Abstract

This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.

Citation Download Citation

Paul J Edwards "Brief history of recombination noise in semiconductor junction devices", Proc. SPIE 5113, Noise in Devices and Circuits, (12 May 2003); https://doi.org/10.1117/12.497117

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