Optoelectronic method for noncontact reconstructing 3D objects surface profile of large sizes

Yury N. Kulchin; Vladimir P. Vasiliev; Yuri Yu. Nikonov

doi:10.1117/12.502158

17 June 2003 Optoelectronic method for noncontact reconstructing 3D objects surface profile of large sizes

Yury N. Kulchin, Vladimir P. Vasiliev, Yuri Yu. Nikonov

Author Affiliations +

Proceedings Volume 5129, Fundamental Problems of Optoelectronics and Microelectronics; (2003) https://doi.org/10.1117/12.502158
Event: Fundamental Problems of Optoelectronics and Microelectronics, 2002, Vladivostok, Russian Federation

Abstract

Optoelectronic method for non-contact reconstructing surface profile of large size 3D objects is investigated in this paper. Optimal parameters for measuring are proposed. It is shown that the given method, as against known, does not require fine tuning of equipment. Numerical method for minimization of errors caused by aberrations distortions is proposed. The step-by-step cells method that allows increasing measurement accuracy.

Citation Download Citation

Yury N. Kulchin, Vladimir P. Vasiliev, and Yuri Yu. Nikonov "Optoelectronic method for noncontact reconstructing 3D objects surface profile of large sizes", Proc. SPIE 5129, Fundamental Problems of Optoelectronics and Microelectronics, (17 June 2003); https://doi.org/10.1117/12.502158

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