The development of an optical computed tomography apparatus for fault detection in transparent materials

Gede B. Suparta; Sumartono Prawirosusanto; Adrianus I. Natalisanto

doi:10.1117/12.500898

30 May 2003 The development of optical computed tomography apparatus for fault detection on transparent materials

Gede B. Suparta, Sumartono Prawirosusanto, Adrianus I. Natalisanto

Proceedings Volume 5144, Optical Measurement Systems for Industrial Inspection III; (2003) https://doi.org/10.1117/12.500898
Event: Optical Metrology, 2003, Munich, Germany

Abstract

A computed tomography (CT) apparatus using laser beam and photodiode is currently developed for faulty detection in transparent materials such as diamonds and crystals. Faults in diamond and crystals are hard to be detected using visual inspection. A unique and artistic feature may appear on the surface due to internal cracks or anomalies. While those are hard to be distinguished, the unique feature appeared may be more precious compare to any perfect objects. A simulation study for understanding the physics behind the phenomena has been performed. This has been followed by set-up of mechanical and sensor system along with the electronics readings. Previous results on individual testing show that we may develop a pretty optical CT system that can be used for fault detection in any transparent materials.

Citation Download Citation

Gede B. Suparta, Sumartono Prawirosusanto, and Adrianus I. Natalisanto "The development of optical computed tomography apparatus for fault detection on transparent materials", Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); https://doi.org/10.1117/12.500898

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