Paper
12 December 2003 A novel geometry for uniform intensity line focus of Gaussian laser beams
Prasad A. Naik, Sudhakar R. Kumbhare, Vipul Arora, Ramavtar Joshi, Parshotam Dass Gupta
Author Affiliations +
Proceedings Volume 5228, ECLIM 2002: 27th European Conference on Laser Interaction with Matter; (2003) https://doi.org/10.1117/12.537395
Event: ECLIM 2002: 27th European conference on Laser Interaction with Matter, 2002, Moscow, Russian Federation
Abstract
Gain measurements in x-ray lasers involves monitoring the intensity of lasing transition as a function of line focus length. Having a line focus of variable length with uniform intensity is important in these measurements. In addition, uniform line focusing of Gaussian laser beams has many other applications in material processing, pumping of dye lasers etc. In this paper, we describe a simple technique using a wedge to displace and overlap two halves of a Gaussian laser beam to obtain a uniform intensity line focus. Variation of the line length at a fixed intensity is facilitated by use of appropriate masks. X-ray emission pictures of a line focused laser produced plasma show the effectiveness of this geometry.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Prasad A. Naik, Sudhakar R. Kumbhare, Vipul Arora, Ramavtar Joshi, and Parshotam Dass Gupta "A novel geometry for uniform intensity line focus of Gaussian laser beams", Proc. SPIE 5228, ECLIM 2002: 27th European Conference on Laser Interaction with Matter, (12 December 2003); https://doi.org/10.1117/12.537395
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KEYWORDS
Plasma

X-rays

Cylindrical lenses

Gaussian beams

Laser applications

Spherical lenses

X-ray lasers

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