Surface Plasmon Resonance (SPR) effect is considered in conditions of the absorption sensing. This sensing implies a formation of a thin absorbent layer with non-zero imaginary part of the dielectric constant on the sensor surface. We study the sensing response of the prism-based coupling system to the thickness increase of different absorbent layers (Au, Cu, Pt, Ag, Al, Si) in both the Attenuated Total Reflection (ATR) and Kretschmann-Raether geometries. The obtained results are of importance for the characterization of the absorbent metal- or semiconductor-based layers and development of nanoparticle-enhanced SPR sensors
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