Paper
19 February 2004 Reflectance for an approximately one-dimensional rough surface that has rms roughness greater than a wavelength
Vladimir Ya. Mendeleev, Sergey N. Skovorod'ko
Author Affiliations +
Proceedings Volume 5381, Lasers for Measurements and Information Transfer 2003; (2004) https://doi.org/10.1117/12.547689
Event: Lasers for Measurements and Information Transfer 2003, 2003, St. Petersburg, Russian Federation
Abstract
A relation between the intensity reflectances of approximately one-dimensional and one-dimensional rough surfaces within the diffraction solid angle in the specular direction for normal incidence is derived for an rms roughness greater than a wavelength. The relation shows that the reflectance of an approximately one-dimensional rough surface is proportional to the reflectance of a one-dimension rough surface. The validity of the derived relation is studied for an approximately one-dimensional rough steel surface with an rms roughness of 1.3 μm and a correlation length of 15.2 μm. The wavelength was 0.6328 μm and the angle of incidence was 4°. The reflectance of the rough steel surface was measured and estimated from the derived relation. Satisfactory agreement was found between the estimated and measured reflectance values.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir Ya. Mendeleev and Sergey N. Skovorod'ko "Reflectance for an approximately one-dimensional rough surface that has rms roughness greater than a wavelength", Proc. SPIE 5381, Lasers for Measurements and Information Transfer 2003, (19 February 2004); https://doi.org/10.1117/12.547689
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Reflectivity

Scattering

Diffraction

Light scattering

Solids

Electromagnetic scattering theory

Photometry

RELATED CONTENT

Laser Scattering From Multi-Scale Surfaces
Proceedings of SPIE (September 03 1985)
Surface-Roughness Monitoring For Industrial Quality Control
Proceedings of SPIE (January 01 1987)
Scattering effects in x-ray imaging systems
Proceedings of SPIE (June 20 1995)

Back to Top