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The precise microwave characterization of dielectric materials is an important issue for emerging technologies of the 21st century. In this paper recent advances in resonant techniques for permittivity and dielectric loss tangent measurements of low and medium loss dielectrics at microwave frequencies are presented.
Jerzy Krupka,Janina E. Mazierska,Mohan V. Jacob,John G. Hartnett, andMichael E. Tobar
"Recent advances in measurements of permitivity and dielectric losses at microwave frequencies", Proc. SPIE 5445, Microwave and Optical Technology 2003, (7 April 2004); https://doi.org/10.1117/12.560676
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Jerzy Krupka, Janina E. Mazierska, Mohan V. Jacob, John G. Hartnett, Michael E. Tobar, "Recent advances in measurements of permittivity and dielectric losses at microwave frequencies," Proc. SPIE 5445, Microwave and Optical Technology 2003, (7 April 2004); https://doi.org/10.1117/12.560676