Effect of the spectral width on mode partition noise in multimode VCSELs

Moncef B. Tayahi; Sivakumar Lanka; Jan Carstens; Lutz Hoffmann

doi:10.1117/12.589290

14 March 2005 Effect of the spectral width on mode partition noise in multimode VCSELs

Moncef B. Tayahi, Sivakumar Lanka, Jan Carstens, Lutz Hoffmann

Author Affiliations +

Proceedings Volume 5737, Vertical-Cavity Surface-Emitting Lasers IX; (2005) https://doi.org/10.1117/12.589290
Event: Integrated Optoelectronic Devices 2005, 2005, San Jose, California, United States

Abstract

The dependence of the mode partition noise (MPN) and the power penalty associated with it can be measured from the source spectral width. Our findings show that there is strong dependence of the carrier lifetime on the bit error rate degradation caused by MPN on the spectral width of the vertical cavity surface emitting laser (VCSEL). VCSELs with smaller spectral width (shorter carrier lifetime) exhibited smaller MPN induced power penalty. We found that the theoretical calculation of the power penalties caused by MPN from the carrier lifetime and the spectral width is in good agreement with the measured system penalties.

Citation Download Citation

Moncef B. Tayahi, Sivakumar Lanka, Jan Carstens, and Lutz Hoffmann "Effect of the spectral width on mode partition noise in multimode VCSELs", Proc. SPIE 5737, Vertical-Cavity Surface-Emitting Lasers IX, (14 March 2005); https://doi.org/10.1117/12.589290

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