Paper
1 April 2005 High-power CW quantum cascade lasers: How short can we go?
Manijeh Razeghi, Allan Evans, Steven Slivken, Jae-Su Yu
Author Affiliations +
Abstract
Limiting factors for short-wavelength CW QCL designs are discussed. A model is used to predict the short-wavelength cutoff for strain-balanced QCL structures. High performance is predicted at wavelengths as short as 3.0 micron based on a conduction band offset of 0.9 eV in the GaInAs/AlInAs materials. Recent work is presented on the growth of strained materials using gas-source molecular beam epitaxy to investigate the model predictions. Advanced material characterization, including high-resolution x-ray diffraction, photoluminescence, atomic force microscopy, and wafer-scale uniformity and repeatability are demonstrated for highly-strained and strain-balanced QCL structures. Laser testing results are presented for QCLs operating near the short wavelength limit at 3.66 micron. Lastly, predictions for further performance improvement at short wavelengths are discussed.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Manijeh Razeghi, Allan Evans, Steven Slivken, and Jae-Su Yu "High-power CW quantum cascade lasers: How short can we go?", Proc. SPIE 5738, Novel In-Plane Semiconductor Lasers IV, (1 April 2005); https://doi.org/10.1117/12.597095
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Cited by 13 scholarly publications.
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KEYWORDS
Quantum cascade lasers

Atomic force microscopy

Superlattices

Waveguides

X-ray diffraction

Gallium

Aluminum

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