Paper
14 February 2005 Proposed methodologies to reduce measurement error impact on coordinate measurement machines
Javier Molina
Author Affiliations +
Proceedings Volume 5776, Eighth International Symposium on Laser Metrology; (2005) https://doi.org/10.1117/12.611636
Event: Eighth International Conference on Laser Metrology, 2005, Merida, Mexico
Abstract
This paper is a result of a review of several papers which are proposing methodologies to reduce the error measurement’s impact on coordinate measuring machines (CMM). The standard used in this paper is the ASME Y14.5M:1994 Dimensioning and Tolerancing which is created for "hard gages" (meaning those that control the full surface of a part) and not for the CMM that only inspect "partially" the surfaces of a part. As a consequence the errors begin since the standard interpretation.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Javier Molina "Proposed methodologies to reduce measurement error impact on coordinate measurement machines", Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); https://doi.org/10.1117/12.611636
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KEYWORDS
Inspection

Tolerancing

Error analysis

Manufacturing

Standards development

Calibration

Optical spheres

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