Paper
1 May 1986 Stress Analysis Of Randomly Loaded Structures Using An Infra-Red Technique
W. M. Cummings, N. Harwood
Author Affiliations +
Proceedings Volume 0590, Infrared Technology and Applications; (1986) https://doi.org/10.1117/12.951994
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
The use of infra-red techniques for full field stress analysis has increased rapidly in the last two or three years, due mainly to the introduction of a production model of the SPATE (Stress Pattern Analysis by Thermal Emission) equipment, developed by Sira Ltd. The Sira technique makes use of the thermoelastic effect by measuring the very small temperature changes which occur when structures are cyclically loaded. This paper describes the investigation of structures under broad-band random loading, using a standard SPATE 8000 together with an add-on hardware/software system developed for this purpose at the National Engineering Laboratory.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. M. Cummings and N. Harwood "Stress Analysis Of Randomly Loaded Structures Using An Infra-Red Technique", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); https://doi.org/10.1117/12.951994
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KEYWORDS
Stress analysis

Computing systems

Data acquisition

Sensors

Signal detection

Mirrors

Signal processing

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