Techniques For Suppressing Optical Interference Errors In Infrared Film Thickness Gauging

Roger F. Edgar; Bernard J. Stay

doi:10.1117/12.952000

1 May 1986 Techniques For Suppressing Optical Interference Errors In Infrared Film Thickness Gauging

Roger F. Edgar, Bernard J. Stay

Proceedings Volume 0590, Infrared Technology and Applications; (1986) https://doi.org/10.1117/12.952000
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

Infrared absorption measurement techniques are widely used in both laboratory and production plant, to measure the thickness and composition of extruded polymer films. Recent developments in film production technology permit the manufacture of transparent films of relatively high refractive index with optically flat and parallel surfaces. Since the optical thickness of such films is comparable with the coherence length of the infrared radiation used, optical interference effects can cause serious errors in the measurement. Various strategies for suppression of interference effects are presented and practical techniques based on these strategies are described.

Citation Download Citation

Roger F. Edgar and Bernard J. Stay "Techniques For Suppressing Optical Interference Errors In Infrared Film Thickness Gauging", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); https://doi.org/10.1117/12.952000

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