Effects of optical back reflection on long wavelength VCSELs

M. Steib; Y. Vandyshev; R. Johnson; G. Franz; Hongyu Deng

doi:10.1117/12.660841

10 February 2006 Effects of optical back reflection on long wavelength VCSELs

M. Steib, Y. Vandyshev, R. Johnson, G. Franz, Hongyu Deng

Proceedings Volume 6132, Vertical-Cavity Surface-Emitting Lasers X; 613205 (2006) https://doi.org/10.1117/12.660841
Event: Integrated Optoelectronic Devices 2006, 2006, San Jose, California, United States

Abstract

Understanding of the noise characteristics of a long wavelength (LW) vertical cavity surface-emitting laser (VCSEL) under optical back reflection is crucial for its applications in optical fiber data communication. VCSELs at near 1.31μm are tested and the relative intensity noise (RIN) is measured in the presence of different levels of optical reflection intensity. Innovative LW VCSEL packaging solutions are demonstrated to achieve robust low cost error-free data communication systems.

Citation Download Citation

M. Steib, Y. Vandyshev, R. Johnson, G. Franz, and Hongyu Deng "Effects of optical back reflection on long wavelength VCSELs", Proc. SPIE 6132, Vertical-Cavity Surface-Emitting Lasers X, 613205 (10 February 2006); https://doi.org/10.1117/12.660841

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