Paper
29 August 2006 Thorium dioxide thin films in the extreme ultraviolet
Nicole F. Brimhall, Amy B. Grigg, R. Steven Turley, David D. Allred
Author Affiliations +
Abstract
We have measured the reflectance and transmittance of thorium dioxide thin films from 50-280 eV. We have developed several methods for fitting this data that gives the most reliable values for the complex index of refraction, n = 1 - δ + iβ. These fitting methods included fitting film thickness using interference fringes in highly transmissive areas of the spectrum and fitting reflectance and transmittance data simultaneously. These techniques give more consistent optical constants than solitary unconstrained fitting of reflectance as a function of angle. Using these techniques, we have found approximate optical constants for thorium dioxide in this energy range. We found that the absorption edges of thoria were shifted 4 eV and 2 eV to lower energies from those of thorium. We also found that the peak in δ was shifted by 3 eV to lower energy from that of thorium.
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Nicole F. Brimhall, Amy B. Grigg, R. Steven Turley, and David D. Allred "Thorium dioxide thin films in the extreme ultraviolet", Proc. SPIE 6317, Advances in X-Ray/EUV Optics, Components, and Applications, 631710 (29 August 2006); https://doi.org/10.1117/12.687201
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Cited by 3 scholarly publications.
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KEYWORDS
Reflectivity

Thorium

Transmittance

Extreme ultraviolet

Reflection

Thin films

Silicon

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