Paper
20 October 2006 Automatic system for determination of dielectric hysteresis loop parameters
Wladyslaw Proszak
Author Affiliations +
Proceedings Volume 6348, Optoelectronic and Electronic Sensors VI; 63480R (2006) https://doi.org/10.1117/12.721112
Event: Optoelectronic and Electronic Sensors VI, 2006, Zakopane, Poland
Abstract
Research works were focused on design and implementation of based on Sawyer-Tower measurement set, computer system, capable to record parameters of dielectric hysteresis loop of non-linear dielectrics. This measurement system makes possible automation and simplification of measurements process and preliminary data processing. Exemplary measurements of temperature characteristics of coercive field and spontaneous polarization of ferroelectric single crystals are also presented in the paper.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wladyslaw Proszak "Automatic system for determination of dielectric hysteresis loop parameters", Proc. SPIE 6348, Optoelectronic and Electronic Sensors VI, 63480R (20 October 2006); https://doi.org/10.1117/12.721112
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KEYWORDS
Dielectrics

Computing systems

Temperature metrology

Dielectric polarization

Capacitors

Crystals

Data processing

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