Design of test system of the control and logic transform device of the flight control system based on FPGA

Liru Wang; Qingrong Zhang

doi:10.1117/12.717123

24 October 2006 Design of test system of the control and logic transform device of the flight control system based on FPGA

Liru Wang, Qingrong Zhang

Author Affiliations +

Proceedings Volume 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence; 63572H (2006) https://doi.org/10.1117/12.717123
Event: Sixth International Symposium on Instrumentation and Control Technology, 2006, Beijing, China

Abstract

The control and logic transform device is the centrum of the flight control system. This paper mainly introduces the design of the circuit of the test system which is used to test the control and logic transform device. Based on the hardware and software, the test system can test and fault diagnose the device according to a series of given test vectors. Besides, the test system can collect and test some flight analog signals, such as the power signal, the pitching signal, the leaning signal, the Mach number, the height number and etc. The test system is made up of the testing object, the logic control and interface circuit and the computer. The functions of collecting the measurands, controlling, arbitrating and converting the logic signals of the circuit are achieved by the test interface circuit, which is mainly integrated in EPF10K20RC240, Field Programmable Gate Array, produced by the Altera semiconductor corporation. This makes the circuit predigested, the integrated level of the system heightened, the size reduced, the stability and the secrecy of the system ensured. This paper introduces the design of the circuit, the working principles of the logic control and interface circuit, stressing how to use the FPGA to realize integrating the test interface circuit mostly. Some details which should be paid much attention to about the emulation and the design are also discussed in this paper. Finally, the paper introduces how to use power MOSFET as the electron switches to switch the multiplex measurands to realize low power consumption.

Citation Download Citation

Liru Wang and Qingrong Zhang "Design of test system of the control and logic transform device of the flight control system based on FPGA", Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572H (24 October 2006); https://doi.org/10.1117/12.717123

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KEYWORDS

Field programmable gate arrays

Logic

Control systems

Control systems design

Logic devices

Clocks

Field effect transistors

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