Paper
5 March 2007 An optical measurement method about line width of pulse laser
Baoan Song, Weijiang Zhao, Deming Ren, Hailong Zhao, Shuang Mo
Author Affiliations +
Proceedings Volume 6595, Fundamental Problems of Optoelectronics and Microelectronics III; 65953P (2007) https://doi.org/10.1117/12.726603
Event: Fundamental Problems of Optoelectronics and Microelectronics III, 2006, Harbin, China
Abstract
The line width of pulse laser is key index to some laser applications. Using finite interferences of high accuracy Fabry- Perot etalon we can measure line width of pulse laser. By this method the line width of a single-longitudinal-mode Nd:YAG laser can be obtained. Reflectance of the etalon used reach 99.8%. The finesse was 300. The accuracy of full width of half height(FWHH) was about 2MHz. It is suitable to measure pulse laser with about 10ns pulse width and 100MHz line width with these parameters.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Baoan Song, Weijiang Zhao, Deming Ren, Hailong Zhao, and Shuang Mo "An optical measurement method about line width of pulse laser", Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 65953P (5 March 2007); https://doi.org/10.1117/12.726603
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KEYWORDS
Pulsed laser operation

Fabry–Perot interferometers

Interferometry

Laser applications

Charge-coupled devices

Laser interferometry

Optical testing

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