Picosecond time-resolved XAFS measurements using femtosecond laser-produced plasma soft x-ray as a probe

Hidetoshi Nakano; Katsuya Oguri; Yasuaki Okano; Tadashi Nishikawa

doi:10.1117/12.740195

15 May 2007 Picosecond time-resolved XAFS measurements using femtosecond laser-produced plasma soft x-ray as a probe

Hidetoshi Nakano, Katsuya Oguri, Yasuaki Okano, Tadashi Nishikawa

Proceedings Volume 6614, Laser Optics 2006: Superintense Light Fields and Ultrafast Processes; 661409 (2007) https://doi.org/10.1117/12.740195
Event: Laser Optics 2006, 2006, St. Petersburg, Russian Federation

Abstract

We have demonstrated the sub-10-ps time-resolved measurement of the x-ray absorption fine structure (XAFS) in laser-excited Si foil by using a femtosecond laser-produced plasma soft x-ray as a probe. We observed a rapid change and recovery in the absorption structure near its L_II,_III edge induced by 100-fs laser pulse irradiation when the laser intensity was in the 10⁹-10¹⁰ W/cm² range. When the incident laser intensity was of the order of 10¹² W/cm², which is higher than the damage threshold, the extended x-ray absorption fine structure (EXAFS) signals clearly revealed inter atomic distance expansion and structural disordering as well as a change in the electronic structure caused by the production of liquid Si. We also describe our recent results on spatio-temporally resolved soft x-ray absorption in an expanding ablated particle cloud from aluminum that was heated with a 10¹⁴-W/cm², 100-fs laser pulse by using an imaging system for time-resolved soft x-ray absorption spectroscopy.

Citation Download Citation

Hidetoshi Nakano, Katsuya Oguri, Yasuaki Okano, and Tadashi Nishikawa "Picosecond time-resolved XAFS measurements using femtosecond laser-produced plasma soft x-ray as a probe", Proc. SPIE 6614, Laser Optics 2006: Superintense Light Fields and Ultrafast Processes, 661409 (15 May 2007); https://doi.org/10.1117/12.740195

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