Paper
11 September 2007 Temperature dependence of Si-based thin film solar cells near phase boundary
Kobsak Sriprapha, Ihsanul Afdi Yunaz, Seung Yeop Myong, Akira Yamada, Makoto Konagai
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Abstract
The temperature dependence of silicon (Si)-based thin film single junction solar cells whose intrinsic absorbers were fabricated near the phase boundary of hydrogenated amorphous silicon (a-Si:H) to hydrogenated microcrystalline silicon (μc-Si:H) was investigated. By varying the hydrogen dilution ratio, wide bandgap protocrytalline silicon (pc-Si:H) and the mixed-phase of a-Si:H and μc-Si:H absorber layers were obtained. Photo J-V characteristics were measured under AM1.5 illumination at ambient temperature in the range of 25-75 °C. We found that the pc-Si:H solar cells which exist below the a-Si:H and µc-Si:H transition boundary exhibited the lowest temperature coefficient (TC) for conversion efficiency (η) and open-circuit voltage (Voc), while the solar cells fabricated at the mixed-phase of a-Si:H and μc-Si:H revealed a relatively high TC for η and Voc. Experimental results indicated that pc-Si:H which fabricated at the silane concentration (SC), SC = [SiH4]/([SiH4]+[H2]), of 5.75% showed the highest initial η, low TC for η and degradation ratio. This material at this condition is a promising for using as an absorber layer of single junction or top cell for tandem solar cells which operating in high temperature regions.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kobsak Sriprapha, Ihsanul Afdi Yunaz, Seung Yeop Myong, Akira Yamada, and Makoto Konagai "Temperature dependence of Si-based thin film solar cells near phase boundary", Proc. SPIE 6651, Photovoltaic Cell and Module Technologies, 665105 (11 September 2007); https://doi.org/10.1117/12.733451
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Cited by 5 scholarly publications.
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KEYWORDS
Solar cells

Temperature metrology

Thin film solar cells

Silicon

Raman spectroscopy

Silicon films

Amorphous silicon

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