Characterization of reflection scanner uniformity

Eric K. Zeise; William C. Kress; Donald R. Williams

doi:10.1117/12.772618

28 January 2008 Characterization of reflection scanner uniformity

Eric K. Zeise, William C. Kress, Donald R. Williams

Proceedings Volume 6808, Image Quality and System Performance V; 680803 (2008) https://doi.org/10.1117/12.772618
Event: Electronic Imaging, 2008, San Jose, California, United States

Abstract

A flatbed reflection scanner is a tempting device to use as a surrogate for a microdensitometer in the evaluation of print image quality. Since reflection scanners were never designed with this purpose in mind, many concerns exist regarding their usefulness as a microdensitometer surrogate. This paper addresses the concerns regarding scan uniformity that must be addressed in order to qualify a reflection scanner for use in print image quality evaluation.

Citation Download Citation

Eric K. Zeise, William C. Kress, and Donald R. Williams "Characterization of reflection scanner uniformity", Proc. SPIE 6808, Image Quality and System Performance V, 680803 (28 January 2008); https://doi.org/10.1117/12.772618

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