Recognition of defect structure of Si(A4) by on-line support vector machine

Tomasz Dziedzic; Janusz Będkowski; Stanisław Jankowski

doi:10.1117/12.784709

28 December 2007 Recognition of defect structure of Si(A4) by on-line support vector machine

Tomasz Dziedzic, Janusz Będkowski, Stanisław Jankowski

Proceedings Volume 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007; 69371W (2007) https://doi.org/10.1117/12.784709
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 2007, Wilga, Poland

Abstract

In this paper the application of on-line support vector machine to spectral surface approximation is presented. The experimental data were obtained by the photocurrent decay measurement as function of time and temperature for a sample of neutron irradiated silicon. This approach enabled to extract the deep level center defect parameters: activation energy and pre-exponential factor.

Citation Download Citation

Tomasz Dziedzic, Janusz Będkowski, and Stanisław Jankowski "Recognition of defect structure of Si(A4) by on-line support vector machine", Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371W (28 December 2007); https://doi.org/10.1117/12.784709

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