Toward in situ x-ray diffraction imaging at the nanometer scale

Nadia A. Zatsepin; Ruben A. Dilanian; Andrei Y. Nikulin; Brian M. Gable; Barry C. Muddle; Osami Sakata

doi:10.1117/12.794438

9 September 2008 Toward in situ x-ray diffraction imaging at the nanometer scale

Nadia A. Zatsepin, Ruben A. Dilanian, Andrei Y. Nikulin, Brian M. Gable, Barry C. Muddle, Osami Sakata

Proceedings Volume 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II; 70420F (2008) https://doi.org/10.1117/12.794438
Event: NanoScience + Engineering, 2008, San Diego, California, United States

Abstract

We present the results of preliminary investigations determining the sensitivity and applicability of a novel x-ray diffraction based nanoscale imaging technique, including simulations and experiments. The ultimate aim of this nascent technique is non-destructive, bulk-material characterization on the nanometer scale, involving three dimensional image reconstructions of embedded nanoparticles and in situ sample characterization. The approach is insensitive to x-ray coherence, making it applicable to synchrotron and laboratory hard x-ray sources, opening the possibility of unprecedented nanometer resolution with the latter. The technique is being developed with a focus on analyzing a technologically important light metal alloy, Al-xCu (where x is 2.0-5.0 %wt). The mono- and polycrystalline samples contain crystallographically oriented, weakly diffracting Al₂Cu nanoprecipitates in a sparse, spatially random dispersion within the Al matrix. By employing a triple-axis diffractometer in the non-dispersive setup we collected two-dimensional reciprocal space maps of synchrotron x-rays diffracted from the Al₂Cu nanoparticles. The intensity profiles of the diffraction peaks confirmed the sensitivity of the technique to the presence and orientation of the nanoparticles. This is a fundamental step towards in situ observation of such extremely sparse, weakly diffracting nanoprecipitates embedded in light metal alloys at early stages of their growth.

Citation Download Citation

Nadia A. Zatsepin, Ruben A. Dilanian, Andrei Y. Nikulin, Brian M. Gable, Barry C. Muddle, and Osami Sakata "Toward in situ x-ray diffraction imaging at the nanometer scale", Proc. SPIE 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II, 70420F (9 September 2008); https://doi.org/10.1117/12.794438

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