Phase error correction for multiple planes using sharpness metrics

Abbie E. Tippie; James R. Fienup

doi:10.1117/12.795193

26 August 2008 Phase error correction for multiple planes using sharpness metrics

Abbie E. Tippie, James R. Fienup

Author Affiliations +

Proceedings Volume 7094, Unconventional Imaging IV; 709404 (2008) https://doi.org/10.1117/12.795193
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Phase errors introduced in the object beam of a digital hologram degrade the image quality of the object. We present computer simulations showing the effect of multiple planes of phase errors in the propagation path. By using a nonlinear optimization technique to maximize sharpness metrics, we show results that account for aberrations in multiple planes and correct anisoplanatic blur. This paper demonstrates this technique for two and three phase screens.

Citation Download Citation

Abbie E. Tippie and James R. Fienup "Phase error correction for multiple planes using sharpness metrics", Proc. SPIE 7094, Unconventional Imaging IV, 709404 (26 August 2008); https://doi.org/10.1117/12.795193

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE