Paper
12 January 2009 Investigation of diode-pumped 1064nm dual-frequency Nd:YAG laser with large frequency-difference
Mingxing Jiao, Junhong Xing, Yun Liu, Yun Yang
Author Affiliations +
Proceedings Volume 7133, Fifth International Symposium on Instrumentation Science and Technology; 71332W (2009) https://doi.org/10.1117/12.812415
Event: International Symposium on Instrumentation Science and Technology, 2008, Shenyang, China
Abstract
When a new birefringent filter consisting of a polarizing beam splitter (PBS) and a half wave-plate (&lgr;/2), i.e., PBS-&lgr;/2 was included in a 1064nm Nd:YAG laser cavity, the laser was enforced to oscillate in single longitudinal mode. The single longitudinal mode selecting ability of the intra-cavity filter of PBS-&lgr;/2 had been studied experimentally by rotating the half wave-plate around the laser cavity axis, and the tuning characteristics of the single-frequency laser output power versus the rotation angle of the half wave-plate had also been studied. An orthogonally and linearly polarized dual-frequency Nd:YAG laser at 1064nm had been designed and demonstrated, which included two standing-wave cavities sharing the same gain medium of Nd:YAG crystal and the birefringent filter of PBS-&lgr;/2, the p-and s-components of the 1064nm laser light simultaneously oscillated in single longitudinal mode in each cavity. The frequency-difference of the dual-frequency laser at 1064nm was measured to be approximately 1.87GHz, limited by the free spectral range of the scanning Fabry-Perot interferometer. It is predicted theoretically that the frequency-difference of the dual-frequency laser at 1064nm can be tuned in a range from zero up to the lasing bandwidth of the Nd:YAG laser.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mingxing Jiao, Junhong Xing, Yun Liu, and Yun Yang "Investigation of diode-pumped 1064nm dual-frequency Nd:YAG laser with large frequency-difference", Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332W (12 January 2009); https://doi.org/10.1117/12.812415
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