Considerations For Accelerated Laser Diode Life Testing

G S Mecherle; J H Engleman

doi:10.1117/12.937479

23 February 1987 Considerations For Accelerated Laser Diode Life Testing

G S Mecherle, J H Engleman

Proceedings Volume 0717, Reliability Considerations in Fiber Optic Applications; (1987) https://doi.org/10.1117/12.937479
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States

Abstract

A more generalized (Eyring) type of acceleration model for laser diodes is discussed which includes temperature, bulk current and optical power as accelerating stresses. This may allow greater accuracy in laser diode lifetime estimation and in prediction of the lifetime implications of changes in laser diode structural design. The effect of redundancy on laser diode lifetime requirements, diode parameters essential to fiber optic and free-space communication system operation, screening procedures, failure analysis, test configurations and environmental/equipment safeguards are also discussed.

Citation Download Citation

G S Mecherle and J H Engleman "Considerations For Accelerated Laser Diode Life Testing", Proc. SPIE 0717, Reliability Considerations in Fiber Optic Applications, (23 February 1987); https://doi.org/10.1117/12.937479

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