New approaches towards the understanding of the catastrophic optical damage process in in-plane diode lasers

Jens W. Tomm; Mathias Ziegler; Vadim Talalaev; Clemens Matthiesen; Thomas Elsaesser; Marwan Bou Sanayeh; Peter Brick; Martin Reufer

doi:10.1117/12.806701

3 February 2009 New approaches towards the understanding of the catastrophic optical damage process in in-plane diode lasers

Jens W. Tomm, Mathias Ziegler, Vadim Talalaev, Clemens Matthiesen, Thomas Elsaesser, Marwan Bou Sanayeh, Peter Brick, Martin Reufer

Author Affiliations +

Proceedings Volume 7230, Novel In-Plane Semiconductor Lasers VIII; 72300V (2009) https://doi.org/10.1117/12.806701
Event: SPIE OPTO: Integrated Optoelectronic Devices, 2009, San Jose, California, United States

Abstract

The microscopic processes accompanying the catastrophic optical damage process in semiconductor lasers are discussed. For 808 and 650 nm edge-emitting broad-area devices relevant parameters such as surface recombination velocities, bulk and front facet temperatures are determined and discussed. Facet temperatures vs. laser output and temperature profiles across laser stripes reveal a strong correlation to near-field intensity and degradation signatures. Furthermore, the dynamics of the fast catastrophic optical damage process is analyzed by simultaneous high-speed infrared thermal and optical imaging of the emitter stripe. The process is revealed as fast and spatially confined. It is connected with a pronounced impulsive temperature flash detected by a thermocamera.

Citation Download Citation

Jens W. Tomm, Mathias Ziegler, Vadim Talalaev, Clemens Matthiesen, Thomas Elsaesser, Marwan Bou Sanayeh, Peter Brick, and Martin Reufer "New approaches towards the understanding of the catastrophic optical damage process in in-plane diode lasers", Proc. SPIE 7230, Novel In-Plane Semiconductor Lasers VIII, 72300V (3 February 2009); https://doi.org/10.1117/12.806701

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available