Paper
18 May 2009 Silicon comb-drive X-Y microstage with frame-in-the-frame architecture for MOEMS applications
Author Affiliations +
Proceedings Volume 7362, Smart Sensors, Actuators, and MEMS IV; 736210 (2009) https://doi.org/10.1117/12.821460
Event: SPIE Europe Microtechnologies for the New Millennium, 2009, Dresden, Germany
Abstract
In this paper we present the silicon comb-drive X-Y microstage with the frame-in-the-frame architecture intended to be monolithically integrated with a glass microlens as a MOEMS 2D scanner for the Miniaturized Confocal Microscope On- Chip. The microstage is characterized by relatively large travel range (± 35 μm in X-direction and ± 28 μm in Y-direction at 100 V) for a small number of driving electrodes, without noticeable mechanical X-Y crosstalk. We describe the design, ANSYS modeling, fabrication process and static characterization of the device.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karolina Laszczyk, Sylwester Bargiel, Jerzy Krężel, Christophe Gorecki, and Małgorzata Kujawińska "Silicon comb-drive X-Y microstage with frame-in-the-frame architecture for MOEMS applications", Proc. SPIE 7362, Smart Sensors, Actuators, and MEMS IV, 736210 (18 May 2009); https://doi.org/10.1117/12.821460
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Cited by 2 scholarly publications.
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KEYWORDS
Silicon

Electrodes

Actuators

Bridges

Deep reactive ion etching

Photoresist materials

Chromium

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