Paper
31 December 2010 Precision control of scale using in industrial close-range photogrammetry
Xiang Guo, Jin Liang, Zhenzhong Xiao, Binggang Cao
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75444Y (2010) https://doi.org/10.1117/12.885678
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
This paper research the effect of scale using in reconstruction of industry close-range photogrammetry. The two major factor of scale using, deviation of scale reconstruction and calibration, are analyzed. Based on the analysis, the equation of deviation in scale using is obtained and verified by the experiment. According to this equation, some requests of scale using to improve the reconstruction accuracy are studied, and a new scale using method, close scale model, is proposed. Using close scale model, it can be reduced the effect of scale using deviation in reconstruction, the accuracy of industrial close-range photogrammetry is improved.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiang Guo, Jin Liang, Zhenzhong Xiao, and Binggang Cao "Precision control of scale using in industrial close-range photogrammetry", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75444Y (31 December 2010); https://doi.org/10.1117/12.885678
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Cited by 1 scholarly publication.
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KEYWORDS
Photogrammetry

Lithium

Photography

3D metrology

3D image processing

Analytical research

3D modeling

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