Application of semiconductor laser on big dimension measuring system

Hongtao Zhang; Xuhua Zhai; Zhou Qu; Hong Zhang

doi:10.1117/12.864295

11 October 2010 Application of semiconductor laser on big dimension measuring system

Hongtao Zhang, Xuhua Zhai, Zhou Qu, Hong Zhang

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 765623 (2010) https://doi.org/10.1117/12.864295
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

The structure and principles of an optical non-contact measuring system of large-dimension diameter were analyzed detailed in the paper. This system can be used to measure up to the diameter of 2200 millimeters. And it also can be used to measure the coaxiality of inner and outside of cirque. Moreover, the system can realize measure on-line parameters in processing. The ultimate errors in measuring large-dimension diameter are less than 0.02 millimeters.

Citation Download Citation

Hongtao Zhang, Xuhua Zhai, Zhou Qu, and Hong Zhang "Application of semiconductor laser on big dimension measuring system", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765623 (11 October 2010); https://doi.org/10.1117/12.864295

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