Research on integrating sphere low-light level stress system

Donglin Yang; Dawei Feng

doi:10.1117/12.864422

11 October 2010 Research on integrating sphere low-light level stress system

Donglin Yang, Dawei Feng

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 76563F (2010) https://doi.org/10.1117/12.864422
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

Low-light level night vision device must be assessed by light stress reliability test in the design approval testing and production approval testing. The low-light level stress environment is the key to light stress reliability test on Low-light level night vision device. This paper studies the actual working environment of Low-light level night vision device from the aspects of night sky spectrum of nature light and illumination, and designs a low-light level stress system. The system consists of double-integrating-sphere light source, light stress automatic switching device, collimator, monitoring and control system for light stress. The system uses a total light source with radiation structure to improve the light efficiency, solve the question of light stress consistency, achieve a typical night-day simulation of the environment and the monitoring and control of the whole process.

Citation Download Citation

Donglin Yang and Dawei Feng "Research on integrating sphere low-light level stress system", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76563F (11 October 2010); https://doi.org/10.1117/12.864422

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