X-ray integrated digital imaging system based on a-si flat panel detector

Jian Fu; Bin Li; Baihong Jiang

doi:10.1117/12.866689

22 October 2010 X-ray integrated digital imaging system based on a-si flat panel detector

Jian Fu, Bin Li, Baihong Jiang

Proceedings Volume 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology; 76585K (2010) https://doi.org/10.1117/12.866689
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

X-ray phase contrast imaging (X-PCI) is one of the novel imaging methods. For the low density substance, it provides better images than the conventional X-ray attenuation imaging. In order to get a high-quality image, X-PCI adopts the high spatial resolution image intensifier as the detector. However, the X-ray attenuation imaging usually adopts the high sensitivity a-si flat panel detector (FPD) as the detector. So it is currently one of the questions in the field of X-ray imaging how to realize these two functions at a system: X-ray attenuation imaging and X-PCI. An X-ray integrated digital imaging system based on FPD is designed and developed after analyzing the imaging principle of X-PCI and the imaging feature of FPD. The results from simulation and experiments in this system show that the X-PCI image can be acquired without affecting the quality of the conventional X-ray attenuation image. It demonstrates the possibility to realize these two functions at a system.

Citation Download Citation

Jian Fu, Bin Li, and Baihong Jiang "X-ray integrated digital imaging system based on a-si flat panel detector", Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76585K (22 October 2010); https://doi.org/10.1117/12.866689

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